About the Conference

MEMS Journal and MEPTEC Present

MEMS Testing and Reliability 2012
4th Annual Conference on MEMS Testing and Reliability

Thursday, October 18, 2012
8AM - 6PM
Biltmore Hotel & Suites
Santa Clara, California

Conference Topics
Who Should Attend
Hotel Information
Contact Information


As MEMS production volumes continue to pick up, there is increased pressure on manufacturers and foundries to reduce costs. MEMS testing has traditionally accounted for 10-45% of the total device costs and can easily affect the profitability level for the device makers. Therefore, MEMS foundries and fabless MEMS companies need to ensure that they have in-house expertise and continual improvement in the area of MEMS testing.

While MEMS testing is similar to IC chip testing in the semiconductors industry, MEMS devices present further challenges because mechanical, chemical and optical parameters must be tested in addition to electrical properties. This event will focus on bringing together the leading MEMS testing experts and relevant equipment suppliers. Additionally, some presence will be given to IC chip test experts so that they could also share their best practices with the audience.

Topics will include:
  • State-of-the-art MEMS testing and reliability strategies
  • Wafer-level MEMS testing
  • Post-packaging MEMS testing
  • Specific tips and techniques
  • MEMS test equipment status and development

By participating in this event, you will ensure that your organization stays current with the latest MEMS testing and reliability techniques; therefore, you will increase yields, decrease waste and increase profitability for your company.

Who Should Attend
  • CTOs
  • CEOs
  • VPs of Engineering
  • MEMS test managers and engineers
  • MEMS foundry managers and engineers
  • MEMS production managers and engineers
  • MEMS design managers and engineers
Hotel Information

A block of rooms are being held as space is available at the Biltmore Hotel at a special rate of $139. Please call 408-988-8411 to reserve your room. Be sure to mention MEMS Journal and MEPTEC in order to secure your special rate.

Contact Information

Dr. Mike Pinelis
MEMS Journal, Inc.

Bette Cooper

(from participants and attendees of MEMS Testing and Reliability 2011)

"I enjoyed this year's conference greatly, and found it to be a great venue for networking and learning new information. The speakers covered a wide variety of topics related to MEMS reliability and test. Also, I was able to interface with a vendors specifically focused on MEMS. Thank you to MEMS Journal and MEPTEC for organizing this event!"
Carl Arft, Director of Test Development Engineering, SiTime

"The MEMS Testing and Reliability conference was very informative and interactive. The conference brought together key people to discuss technical issues for MEMS testing in a comfortable environment. The speakers were well chosen based on their expertise and background with MEMS testing. Our company found it to be a valuable experience for discussing potential applications for our technology."
Eric Lawrence, MEMS Business Development Manager, Polytec

"This was my first MEMS Test and Reliability conference. I found all the presentations to be very informative and insightful. The event covered all aspects of MEMS test and reliability. It was a good decision for me to attend this conference since I learned about the current and future MEMS market, the reliability requirements for different MEMS devices especially for the automotive under the hood applications, and the current and future challenges of testing MEMS devices. I am looking forward to attending more of these events in the future."
Gus Karavakis, Director of Pilot Manufacturing, Centipede Systems

"I thought the conference was well organized. Most of the speakers were well prepared and finished on time. I also found the atmosphere to be quite friendly. I did find a couple of old friends as well. MEMS is still a small circle and it's always good to run into friends. Good job!"
David Hong, Project Manager, Fujifilm Dimatix

"This event provided me with an abundant of information on strategies in testing MEMS efficiently and adequately in a production level. I was able to find many methods talked about during the conference and apply to our testing strategies almost immediately. The event also included multiple case studies that present a real issues that is encounter in real MEMS business, which allows you to avoid similar mistakes in your own field. The conference greatly improved my knowledge in MEMS testing and I high recommend this in anyone interested in the MEMS industry."
Yingxiang Cheng, Lab Manager, Sensors in Motion

"This was an excellent technical conference. I found it is useful and valuable course for manufacturing testing, reliability and cost. I highly recommend this event for MEMS Test engineering, design engineering manufacturing engineering, operations manager and business executives to attend. It provided lot of good real practical examples and experiences of current challenges in the MEMS industry. It was a great event!"
Tom Nguyen, Founder and CEO, AVsensors